Hitachi X-MET 8000 Optimum
Portable X-ray fluorescence (XRF) spectrometer designed to deliver high-accuracy material composition analysis across various industries. This device allows users to identify and measure the concentration of elements in a range of materials, including metals, alloys, soils, and plastics, without damaging the tested samples.
With its lightweight and ergonomic design, the X-MET 8000 Optimum makes it easy for professionals in the field to perform rapid and efficient analyses on-site. The instrument features a color touchscreen display that is easily readable even under bright sunlight, as well as an intuitive user interface, allowing users to quickly master its operation.
The Hitachi X-MET 8000 Optimum also offers advanced analysis capabilities with short measurement times. The device uses a sensitive silicon drift detector (SDD) to provide highly accurate and reliable results. It supports the measurement of a wide range of elements, from magnesium (Mg) to uranium (U), making it ideal for various applications, including environmental testing, production process monitoring, and raw material quality inspection.
Benefits:
- Enhanced Efficiency: The portable design and rapid measurement capabilities allow for quick, on-site analysis, reducing the need for sample transport and laboratory processing time.
- High Accuracy: The use of a silicon drift detector (SDD) ensures precise and reliable results, which is crucial for making informed decisions based on accurate data.
- Versatile Application: With its ability to measure a wide range of elements, the X-MET 8000 Optimum is suitable for diverse applications, including environmental testing, quality control, and material verification.
- Ease of Use: The intuitive user interface and color touchscreen make the device user-friendly, even for those with minimal experience, allowing for quick setup and operation.
- Durability: Its rugged construction and resistance to water and dust make it reliable in tough field conditions, ensuring consistent performance even in harsh environments.
- Cost Savings: By enabling immediate analysis on-site, the device helps to reduce costs associated with sample transport, laboratory testing, and delays in obtaining results.
- Real-Time Data Transfer: Wi-Fi and Bluetooth connectivity facilitate easy data transfer to other devices, streamlining data management and enabling real-time decision-making.
- Operational Flexibility: The device’s tolerance to various temperatures and environmental conditions ensures it remains functional and accurate across different settings.
- Informed Decision Making: Quick and accurate material analysis helps in making timely and informed decisions, which is crucial for quality control, regulatory compliance, and operational efficiency.
- Reduced Environmental Impact: The non-destructive testing capability means that samples are not damaged, minimizing waste and preserving resources.
General Specifications
- Technology: X-ray fluorescence (XRF)
- Measurement Type: Non-destructive elemental analysis
- Elemental Range: Typically from Mg (magnesium) to U (uranium), depending on the sample and conditions
- Detector: Large area silicon drift detector (SDD) for high-speed analysis and low detection limits
- X-Ray Tube: 50 kV X-ray tube with rhodium (Rh) anode for efficient excitation
- Detector: Silicon Drift Detector (SDD)
- Element Range: Magnesium (Mg) to Uranium (U)
- Display: Color touchscreen
- Connectivity: Wi-Fi, Bluetooth
- Construction: Water and dust resistant
- Operating Temperature: Functional across a wide temperature range
- Dimensions and Weight: Lightweight and ergonomic, easy to carry
- Measurement Speed: Fast measurements with short analysis times
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